Memory tester

About i 7400 Series

​*DRAM Component & Module Test ATE​
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  • DDR4, DDR5 full test function hardware architecture
  • 2.4 Gbps/ 3.2Gbps high-speed clock
  • 32site/ concurrent tester.
  • Up to 512 Parallel per system
About EX 8000 Series


  •  2133Mbps, 512 DUT Parallel DDR SDRM​
  • DDR2, DDR3 full test function hardware architecture
  • 2133Mbps High-Speed Clock & DQS mode support
  • (High-Speed Clock : 1,024ch/System)
  • Scalable system architecture up to 512 Parallel per system
  • Available TOF function up to 100MHz for cell & core test
  • User friendly with GUI
  • Application devices : DDR2, DDR3 SDRAM mass production
About EX 7000 Series




  • 800MHz/1.6Gbps,
  • 256 DUT Parallelism DDR , SDRAM Component test system
About Scenario Series

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  • Inline Memory Module DC Tester (i1210/ i1206)
  • High accuracy DC measure test solution for memory module..
  • Up to 6 Parallel Simultaneous Test.
  • DC test item : Input/ Output pin Open, Short, Leakage,
  • SPD Function support
  • Compact size, simple system installation & maintenance.
SSD tester
About DUO portable system



  • Providing a test environment for developers
  • ​Cope with next generation Protocol development
TRIO test system

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  • PCLe Gen4
  • Multi Protocol (NVMe / SAS/ SATA)
  • Latest U.2, U.3 / EDSFF/ M.2, M.3 / AIC
  • 4 Chamber (60/ 120/ 240 Para)
  • Automotive Chamber (-10 ~ 105 ⁰C)
  • SMART Temperature Control
About SST 12K / SST24UF


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  • SSD Aging tester
  • SATA2,3 / SAS 6G, 12G / PCIe Gen2, 3 / NVMe
  • 240Parallel / Quad Chamber System
  • Chamber door automation
  • Storage BIST mode (SST24UF)
  • Chamber temp. range : -20℃~125 ℃ 
About EST 3000/6000/12K



  • Target devices : eStorage device(UFS-I)
  • Multi Test Count : 256 Parallel
  • Frequency : 6.0Gbps
  • Functions : Support PIO & NCA mode, User command
  • User Interface with GUI (Handler Interface)Paragraph.
Picture

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